JEDEC® Releases New SiC Guidelines to Improve Reliability and Evaluation in Power Electronics

ARLINGTON, Va.--(BUSINESS WIRE)--JEDEC Solid State Technology Association, the global leader in standards development for the microelectronics industry, announced the publication of JEP203: Guideline for Short Circuit Evaluation in Power Conversion Transistors and JEP204: Catalog of Stress Procedures for Silicon Carbide Devices for Power Electronic Conversion, developed by JEDEC’s JC-70.2 Silicon Carbide Subcommittee. JEP203 and JEP204 are available for free download from the JEDEC website.

The two documents support the growing adoption of SiC power semiconductors. JEP203: Guideline for Short Circuit Evaluation in Power Conversion Transistors, provides guidance for evaluating short-circuit capability of power MOSFETs, helping engineers improve protection design, testing consistency, and system robustness in applications such as electric vehicles, industrial drives, and energy infrastructure.

JEP204: Catalog of Stress Procedures for Silicon Carbide Devices for Power Electronic Conversion, is a comprehensive reference covering reliability, environmental, and ruggedness stress procedures for SiC power devices. The publication gives qualification engineers and device manufacturers a common framework for evaluating long-term reliability and performance, helping accelerate industry alignment and increase confidence in next-generation power electronics.

“JEP203 and JEP204 are landmark guidelines for SiC power conversion, enabling the industry to confidently adopt silicon carbide in demanding power electronic applications. JEP204, in particular, provides a comprehensive framework of best practices for stressing SiC power devices, offering significant value to both users and suppliers. Together, these documents reflect years of industry collaboration and mark a historic milestone in advancing the reliability, safety, and standardization of SiC technology,” noted Dr. Donald Gajewski, Wolfspeed Senior Director Reliability Engineering, and the chair of the 702_1 Task Group.

“As the power electronics industry accelerates its transition to silicon carbide, standardization is the catalyst for confidence and scale. The release of JEP203 and JEP204 delivers exactly that: clear guidelines for short-circuit protection design and a unified stress-test framework for long-term SiC reliability. These new documents give engineers and manufacturers the tools to design safer systems, validate long-term reliability, and align industry practices,” said Dr. Thomas Aichinger, Senior Principal Engineer, SiC Technology Development, Infineon Technologies, and the vice-chair of the JC-70.2 subcommittee.

About JC-70

Formed in October 2017 with twenty-three member companies, JC-70 now has over 70 member companies, which underscores industry commitment to the development of universal standards to help advance the adoption of wide bandgap (WBG) power technologies. Global multinational corporations and technology startups from the US, Europe, Middle East, and Asia are working together to bring to the industry a set of standards for reliability, testing, and parametrics of WBG power semiconductors. Committee members include industry leaders in power GaN and SiC semiconductors, as well as users of wide bandgap power devices, and test and measurement equipment suppliers. Technical experts from universities and national labs also provide input.

Interested companies worldwide are welcome to join JEDEC to participate in this important standardization effort. The next JC-70 committee meeting will be held on July 15, 2026. Contact Emily Desjardins (emilyd@jedec.org) for more information or visit www.jedec.org.

About JEDEC

JEDEC is the global leader in the development of standards for the microelectronics industry. Thousands of volunteers representing over 380 member companies work together in more than 100 JEDEC committees and task groups to meet the needs of every segment of the industry, for manufacturers and consumers alike. The publications and standards generated by JEDEC committees are accepted throughout the world. All JEDEC standards are available for download from the JEDEC website. For more information, visit https://www.jedec.org.